Fig. 2From: Influence of electron distribution on efficiency droop for GaN-based light emitting diodes a ω-2θ scan curves of these three GaN-based LEDs measured by the high resolution X-ray diffraction; b Indium concentrations measured by SIMS for the MQWs of these three LEDs; c, d Bright field TEM images and Indium concentrations measured by SIMS for the three pairs of quantum wells/barriers near the p-GaN of LED II and LED III: LED I is In0.13Ga0.87N/GaN–based LED, LED II is In0.14Ga0.86N/In0.03Ga0.97N–based LED and LED III is In0.13Ga0.87N/In0.07Ga0.93N-based LEDBack to article page