SEM-EDX-CL. (left) Backscattered electron image (top) of the Sr0.25Ba0.75Si2O2N2:Eu2+ powder, along with EDX maps for barium and silicon (bottom). (middle) Maps for the peak emission wavelength (λmax), the FWHM and the emission intensity in the wavelength range (550–650 nm) relative to the total emission intensity. (right) Correlation between peak wavelength and FWHM (top) and emission spectra (bottom) for the three selected areas indicated in the CL map. All maps (EDX and CL) are corresponding to the area indicated by the blue rectangle on the backscattered electron image. All data obtained at a sample temperature of 255 K.